Atomic Force Microscopy in Nanobiology by Kunio Takeyasu
English | 15 May 2014 | ISBN: 9814411582 | 444 Pages | PDF | 7 MB
Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement.
Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement.
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